Published May 1, 2000
| Version v1
Journal article
Sub-picosecond bunch length measurement at the TESLA test facility
Creators
Description
Sub-picosecond electron bunches are required for the operation of future VUV and X-ray Free Electron Lasers. A streak camera, a Martin-Puplett interferometer and a longitudinal phase space rotation method have been applied at the TESLA Test Facility linac to measure electron bunch lengths
Additional details
Identifiers
- PII
- S0168900200001406;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 445
- Journal Issue
- 1-3
- Journal Page Range
- p. 343-347
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34038260
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM BUNCHING; ELECTRON BEAMS; FREE ELECTRON LASERS; LENGTH; LINEAR ACCELERATORS; TEST FACILITIES; X-RAY SOURCES
- Descriptors DEC
- ACCELERATORS; BEAM DYNAMICS; BEAMS; DIMENSIONS; DYNAMICS; LASERS; LEPTON BEAMS; MECHANICS; PARTICLE BEAMS; RADIATION SOURCES
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.