Published July 2008
| Version v1
Journal article
Application research of wavelet multi-resolution analysis to X-ray fluorescence spectrum background subtraction
- 1. Chengdu Univ. of Technology, Chengdu (China)
- 2. College of Nuclear Technology and Automated Engineering, Chengdu (China)
Description
X-ray fluorescence analysis superposes the characteristic X-ray full energy peaks on some background. The effect of background subtraction influences the precision of X-ray fluorescence measure. X-ray fluorescence spectrum is made up of full energy peaks and background. We make the peak line and background peel using Wavelet Multi-resolution Analysis and carry out the effect of Background Subtraction. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 28
- Journal Issue
- 4
- Journal Page Range
- p. 853-856
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 41064659
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; BACKGROUND RADIATION; DATA PROCESSING; PEAKS; RESOLUTION; SPECTRA; WAVE FUNCTIONS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; FUNCTIONS; NONDESTRUCTIVE ANALYSIS; PROCESSING; RADIATIONS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 4 figs., 9 refs.