Published 2000
| Version v1
Journal article
HREM studies on the microstructure of severely cold-rolled TiNi alloy after reverse martensitic transformation
Creators
- 1. Lab. of Atomic Imaging of Solids, Inst. of Metal Research, Chinese Academy of Sciences, Shenyang (China)
- 2. Harbin Inst. of Technol. (China). Sch. of Mater. Sci. and Eng.
Description
The microstructure of Ti-49.8at.%Ni alloy, which was cold rolled to about 30% reduction in thickness in its martensitic condition and subsequently heated up to 200 C for half an hour, has been studied by high resolution electron microscopy. The interface between parent phase and martensite is not smooth and well coherent. The boundary between two subgrains of the parent phase is not straight but perfectly coherent, with partial dislocation observed at the interface. Inside some parent phase grains, thin plate-like {114} and spear-like {112} twin-related parent phase variant pairs are observed. The {114} twinning boundary is relatively straight, but with two or three atomic-height blurred layers existing near the interface. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 327-328
- Journal Page Range
- p. 159-162
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- International symposium and exhibition on shape memory materials (SMM '99)
- Dates
- 19-21 May 1999
- Place
- Kanazawa (Japan)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 31024995
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COLD WORKING; DISLOCATIONS; ELECTRON DIFFRACTION; INTERFACES; NICKEL ALLOYS; ROLLING; SHAPE MEMORY EFFECT; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; FABRICATION; LINE DEFECTS; MATERIALS WORKING; MICROSCOPY; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- 7 refs.