Ar 3p photoelectron sideband spectra in two-color XUV + NIR laser fields
Creators
- 1. Graduate School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
- 2. Institute of Material Structure Science, KEK, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)
- 3. Quantum Science and Engineering Center, Kyoto University, Uji 611-0011 (Japan)
- 4. Institute of Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581 (Japan)
- 5. Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
- 6. Department of Nuclear Engineering, Kyoto University, Kyoto 615-8540 (Japan)
- 7. RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)
Description
We performed photoelectron spectroscopy using femtosecond XUV pulses from a free-electron laser and femtosecond near-infrared pulses from a synchronized laser, and succeeded in measuring Ar 3p photoelectron sideband spectra due to the two-color above-threshold ionization. In our calculations of the first-order time-dependent perturbation theoretical model based on the strong field approximation, the photoelectron sideband spectra and their angular distributions are well reproduced by considering the timing jitter between the XUV and the NIR pulses, showing that the timing jitter in our experiments was distributed over the width of ps. The present approach can be used as a method to evaluate the timing jitter inevitable in FEL experiments. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6455/aab257Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. B, Atomic, Molecular and Optical Physics
- Journal Volume
- 51
- Journal Issue
- 7
- Journal Page Range
- [8 p.]
- ISSN
- 0953-4075
- CODEN
- JPAPEH
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52021390
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ANGULAR DISTRIBUTION; APPROXIMATIONS; COLOR; EXTREME ULTRAVIOLET RADIATION; FREE ELECTRON LASERS; IONIZATION; LASER RADIATION; PHOTOELECTRON SPECTROSCOPY; PULSES; TIME DEPENDENCE
- Descriptors DEC
- CALCULATION METHODS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; LASERS; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SPECTROSCOPY; ULTRAVIOLET RADIATION