Published November 1995
| Version v1
Report
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SVX/silicon detector studies
Creators
- 1. Fermi National Accelerator Lab., Batavia, IL (United States)
- 2. Institute of High Energy Physics, Beijing, BJ (China)
Description
AC coupled silicon detectors, being used for the DO upgrade, may have substantial voltage across the coupling capacitor. Failed capacitors can present ∼50 V to the input of the SVX, Silicon Vertex, device. We measured the effects that failed detector coupling capacitors have on the SVXD (rad soft 3μm), SVXH (rad hard 1.2μm), and SVXIIb (rad soft 1.2μm) amplifier / readout devices. The test results show that neighboring channels saturate when an excessive voltage is applied directly to a SVX channel. We believe that the effects are due to current diffusion within the SVX substrate rather than surface currents on the detectors. This paper discusses the magnitude of the saturation and a possible solution to the problem
Availability note (English)
MF available from INIS under the Report Number; Also available from OSTI as DE96004284; NTIS; US Govt. Printing Office Dep.Files
27048341.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 5 p.
- Report number
- FNAL/C--95/351
Conference
- Title
- IEEE nuclear science symposium and medical imaging conference.
- Dates
- 23-28 Oct 1995.
- Place
- San Francisco, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27048341
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAPACITORS; ELECTRICAL TESTING; FERMILAB COLLIDER DETECTOR; RADIATION HARDENING; SI SEMICONDUCTOR DETECTORS; SILICON
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELEMENTS; ENERGY STORAGE SYSTEMS; EQUIPMENT; HARDENING; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; PHYSICAL RADIATION EFFECTS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SEMIMETALS; TESTING
Optional Information
- Contract/Grant/Project number
- Contract AC02-76CH03000
- Funding organization
- USDOE, Washington, DC (United States).
- Secondary number(s)
- CONF-951073--13.