Prediction of failure time for floating gate ROM devices at low dose rate in space radiation environment

The experiments of ionizing radiation were performed on floating gate ROM devices by using 60Co γ-rays. The experimental aim was to examine the radiation response at various dose rates. According to the extrapolation technique and the defined failure criteria , the parameter failure and function failure of devices vs. dose rate were studied. Finally, based on the function of failure time vs. dose rate, the failure time of floating gate ROM device in space radiation environment was predicted