Incorporation in Langmuir–Blodgett films of an amphiphilic derivative of fullerene C60 and oligo-para-phenylenevinylene
Creators
- 1. Instituto de Ciencias Nucleares, Universidad Nacional Autónoma de México (UNAM), Circuito Exterior, CU, C.P. 04510, D.F. (Mexico)
- 2. CIATEQ, A.C., Centro de Tecnología Avanzada, Circuito de la Industria Poniente Lote: 11, Mza. 3, No. 11, Colonia Parque Industrial Ex Hacienda Doña Rosa, Lerma C.P. 52004, Estado de México (Mexico)
- 3. Facultad de Ciencias, UNAM, Circuito Exterior, C.U., C.P. 04510, D.F. (Mexico)
Description
Langmuir (L) and Langmuir–Blodgett (LB) films of fullerene C60–oligo-para-phenylenevinylene (OPV) derivative with six C12H25 aliphatic chains were characterized. For the Langmuir films, isotherms of surface pressure versus molecular area, compression/expansion cycles (hysteresis curves) and Brewster angle microscopic images were obtained. We performed molecular mechanics and density functional theory calculations to determine the molecular and electronic structure of our compound at a water–air interface. We found agreement between experimental and theoretical values for the molecular surface area. LB films of up to ten layers were obtained on glass substrates, and were characterized by ultraviolet–visible spectroscopy. We observed that the absorbance at a wavelength of 326 nm grows almost linearly as a function of the number of layers. Films on glass-indium tin oxide were characterized by atomic force microscopy. We also observed a uniform deposition over the whole area of the scanned substrate. We demonstrated that the fullerene C60–OPV derivative is able to form both L and LB films preventing fullerene aggregation with its aliphatic chains. We suggest that, due to its electron-acceptor properties, the C60–OPV derivative could be used for organic–photovoltaic and organic–electronic applications. - Highlights: ► We performed isotherm and hysteresis studies of fullerene derivative compound. ► We found that the theoretical and experimental molecular areas agree. ► We deposited Langmuir–Blodgett (LB) films on glass-indium tin oxide. ► LB films were characterized using UV–visible spectroscopy. ► We observed the morphology of the LB films through atomic force microscopy.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.10.059Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.10.059;
- PII
- S0040-6090(12)01329-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 526
- Journal Page Range
- p. 246-251
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44103838
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BINDING ENERGY; DENSITY FUNCTIONAL METHOD; DEPOSITION; DEPOSITS; ELECTRONIC STRUCTURE; FILMS; FULLERENES; GLASS; HYSTERESIS; INDIUM; INTERFACES; ISOTHERMS; LAYERS; MORPHOLOGY; PHOTOVOLTAIC EFFECT; SPECTROSCOPY; SURFACE AREA; SURFACES; TIN OXIDES
- Descriptors DEC
- CALCULATION METHODS; CARBON; CHALCOGENIDES; ELEMENTS; ENERGY; METALS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC EFFECT; SURFACE PROPERTIES; TIN COMPOUNDS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.