Published 1982 | Version v1
Report Open

Large-aperture gas Cherenkov counter with wave shifter

Creators

  • 1. Moskovskij Gosudarstvennyj Univ. (USSR). Nauchno-Issledovatel'skij Inst. Yadernoj Fiziki
  • 2. Joint Inst. for Nuclear Research, Dubna (USSR). Lab. of Nuclear Problems

Description

A gas threshold Cherenkov counter having an aperture of 1x0.5 m is described. The counter has been designed for detection of electrons (positrons), distributed in the +-10 deg angular range. It is filled with freon-12 at atmospheric pressure. Photomultipliers with inlet window made of usual glass and Cherenkov light spectrum shifters enlarging the output signal by 1.5 times are used. The counter has 2 mirrors, each with dimensions of 750x600 mm having the form near the elliptical one, the curvature of mirror may be changed. A deviation of the amplitude from the mean value due to variation of particai exit coordinates does not exceed +-8.5%

Availability note (English)

MF available from INIS under the Report Number.

Files

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Additional details

Additional titles

Original title (Russian)
Широкоапертурный газовый черенковский счетчик со смесителем спектра

Publishing Information

Imprint Pagination
6 p.
Report number
JINR--13-82-818

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
14777025
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
APERTURES; BACKGROUND NOISE; CHERENKOV COUNTERS; DIAGRAMS; EFFICIENCY; ELECTRON DETECTION; ELLIPTICAL CONFIGURATION; FOCUSING; FREONS; GEV RANGE 01-10; MEDIUM PRESSURE; MEV RANGE 100-1000; MIRRORS; PHOTOMULTIPLIERS; POSITRONS; SPECIFICATIONS; THRESHOLD DETECTORS
Descriptors DEC
ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; CHARGED PARTICLE DETECTION; CONFIGURATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; GEV RANGE; INFORMATION; LEPTONS; MATTER; MEASURING INSTRUMENTS; MEV RANGE; NEUTRON DETECTORS; NOISE; OPENINGS; ORGANIC COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; PHOTOTUBES; RADIATION DETECTION; RADIATION DETECTORS

Optional Information

Notes
2 refs.; 4 figs.; submitted to the journal Instrum. Exp. Tech.