Published 2003
| Version v1
Journal article
Tritium imaging with a DEPFET pixel imaging matrix
Creators
- 1. Univ. Bonn, Physikalisches Inst. (Germany)
- 2. Univ. Mannheim, Technische Informatik (Germany)
- 3. MPI Halbleiterlabor, Muenchen (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Tritium Imaging mit einer DEPFET Pixel Imaging Matrix
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 38
- Journal Issue
- 2
- Journal Page Range
- p. 58-59
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 2003 spring meeting of the German Physical Society, Particle Physics Section, with physics and book exhibition
- Original Conference Title
- Fruehjahrstagung 2003 der Deutschen Physikalischen Gesellschaft (DPG), Fachverband Teilchenphysik, mit Physik- und Buchausstellung
- Dates
- 10-13 Mar 2003
- Place
- Aachen (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 34039261
- Subject category
- S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- AUTORADIOGRAPHY; BACKGROUND NOISE; BETA DETECTION; BETA RADIOGRAPHY; BETA-MINUS DECAY; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUITS; JUNCTION TRANSISTORS; PARTICLE DISCRIMINATION; POSITION SENSITIVE DETECTORS; REAL TIME SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; SPATIAL RESOLUTION; TEMPERATURE RANGE 0273-0400 K; TRACER TECHNIQUES; TRITIUM
- Descriptors DEC
- BETA DECAY; BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; CHARGED PARTICLE DETECTION; DECAY; DETECTION; ELECTRONIC CIRCUITS; ELEMENTS; HYDROGEN ISOTOPES; INDUSTRIAL RADIOGRAPHY; ISOTOPE APPLICATIONS; ISOTOPES; LIGHT NUCLEI; MATERIALS TESTING; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; NOISE; NONDESTRUCTIVE TESTING; NUCLEAR DECAY; NUCLEI; ODD-EVEN NUCLEI; PARTICLE IDENTIFICATION; RADIATION DETECTION; RADIATION DETECTORS; RADIOISOTOPES; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMIMETALS; TEMPERATURE RANGE; TESTING; TRANSISTORS; YEARS LIVING RADIOISOTOPES