Published August 2010
| Version v1
Journal article
Structure and Mechanical Properties of CrN Thick Films Deposited by High-Rate Medium-Frequency Magnetron Sputtering
- 1. Accelerator Laboratory, Department of Physics and Acoustic and Photonic Materials and Devices of Ministry of Education, Wuhan University, Wuhan 430072 (China)
Description
A home-made electron source assisted medium-frequency (MF) magnetron sputtering system was used to deposit thick CrN films on silicon and tungsten carbide substrates at various nitrogen flow rates with a fixed total pressure (0.3 Pa) and MF power (11.2 kW). Result from scanning electron microscopy showed that the deposited CrN films have clear columnar structure, and X-ray diffraction revealed a preferred orientation of CrN (200) for samples prepared at a rate of N2/(N2+Ar) below 60%, whereas those prepared at higher N2/(N2+Ar) rate are dominated by Cr2N. Deposition rates up to 12.5 μm/h were achieved and the hardness of the CrN coatings were in a range of 11 GPa to 18 GPa.
Availability note (English)
Available from http://dx.doi.org/10.1088/1009-0630/12/4/12Additional details
Identifiers
Publishing Information
- Journal Title
- Plasma Science and Technology
- Journal Volume
- 12
- Journal Issue
- 4
- Journal Page Range
- p. 442-446
- ISSN
- 1009-0630
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42036602
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM NITRIDES; DEPOSITION; ELECTRON SOURCES; FILMS; GRAIN ORIENTATION; HARDNESS; MAGNETRONS; SCANNING ELECTRON MICROSCOPY; SILICON; SPUTTERING; SUBSTRATES; TUNGSTEN CARBIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHROMIUM COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; MECHANICAL PROPERTIES; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NITRIDES; NITROGEN COMPOUNDS; ORIENTATION; PARTICLE SOURCES; PNICTIDES; RADIATION SOURCES; REFRACTORY METAL COMPOUNDS; SCATTERING; SEMIMETALS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS