Synchrotron powder X-ray diffractometer beamline at J. Bennett Johnston, Sr., Center for Advanced Microstructures and Devices
Creators
- 1. J. Bennett Johnston Sr., Center for Advanced Microstructures and Devices, Louisiana State University, Baton Rouge, LA (United States)
- 2. Department of Biochemistry, University of Wisconsin, Addition Room 6624, Madison, WI 53706 (United States)
Description
The J. Bennett Johnston, Sr., Center for Advanced Microstructures and Devices (CAMD) is a synchrotron ring operating at 1.3 GeV, with the ring current typically ranging from 230 to 100 mA. An X-ray powder diffraction beamline was recently commissioned at CAMD at the bending magnet port 7A. The powder diffraction beamline consists of a Brazilian-designed double crystal monochromator, a Huber four-circle diffractometer, and a Canberra germanium solid-state detector. The monochromator is equipped with Si 111 and Ge 220 crystals. The Canberra high purity germanium solid-state detector has a resolution of 130 eV at Mn Kα. For typical use, the diffractometer circle is set to 17 cm, and the source and receiving slits have been set to 300 and 200 μm, respectively. A sample spinner is used for improved particle size averaging. Wavelength can be shifted in a matter of minutes. Preliminary runs of NIST standards, for example, lanthanum hexaboride (LaB6) (SRM 660a), show good performance over a wide two-theta range. Rietveld refinement of novaculite (SiO2) shows lower residual error for the same mineral compared to that obtained from a run with a conventional X-ray source. At the beamline, the user can use MDI's Jade version 7.5 software. The user also has access to International Center for Diffraction Data's Powder Diffraction File-2 database consisting of more than 163,000 inorganic entries and International Crystal Structure Data's crystal structure database with more than 93,000 entries
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.08.240Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.08.240;
- PII
- S0168-9002(07)01752-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 582
- Journal Issue
- 1
- Journal Page Range
- p. 84-86
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 14. national conference on synchrotron radiation research
- Acronym
- SRI 2007
- Dates
- 25-27 Apr 2007
- Place
- Baton Rouge, LA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39064171
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM BENDING MAGNETS; CALIBRATION STANDARDS; COMPUTER CODES; CRYSTAL STRUCTURE; CRYSTALS; GERMANIUM; GEV RANGE; HIGH-PURITY GE DETECTORS; LANTHANUM; LANTHANUM BORIDES; MICROSTRUCTURE; MONOCHROMATORS; POWDERS; RING CURRENTS; SILICA; SYNCHROTRONS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; X-RAY SOURCES
- Descriptors DEC
- ACCELERATORS; BORIDES; BORON COMPOUNDS; COHERENT SCATTERING; CURRENTS; CYCLIC ACCELERATORS; DIFFRACTION; DIFFRACTOMETERS; ELECTRIC CURRENTS; ELEMENTS; ENERGY RANGE; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; LANTHANUM COMPOUNDS; MAGNETS; MEASURING INSTRUMENTS; METALS; MINERALS; OXIDE MINERALS; RADIATION DETECTORS; RADIATION SOURCES; RARE EARTH COMPOUNDS; RARE EARTHS; SCATTERING; SEMICONDUCTOR DETECTORS; STANDARDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.