Published 2006
| Version v1
Journal article
Structural and electronic analysis of Hf on Si(111) surface studied by angle-scanned photoelectron diffraction
Creators
- 1. Instituto de Fisica, Universidade Estadual de Campinas, SP (Brazil)
- 2. Experimentelle Physik 1, Universitaet Dortmund (Germany)
- 3. DELTA - Dortmunder Elektronenspeicherring Test Anlage, Dortmund (Germany)
- 4. Laboratorio Nacional de Luz Sincrotron, Campinas, SP (Brazil)
Description
no abstract available
Availability note (English)
Also available online: http://www.dpg-tagungen.deAdditional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 41
- Journal Issue
- 1
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division
- Original Conference Title
- Tagung des Arbeitskreises Festkoerperphysik (AKF) der Deutschen Physikalischen Gesellschaft (DPG) und der Condensed Matter Division der European Physical Society (EPS)
- Dates
- 27-31 Mar 2006
- Place
- Dresden (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 38006381
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- ANNEALING; ELECTRON DIFFRACTION; ELECTRON SPECTRA; ELECTRONIC STRUCTURE; EMISSION SPECTRA; EV RANGE 100-1000; HAFNIUM; HAFNIUM SILICIDES; PHOTOELECTRIC EMISSION; SILICON; SUBSTRATES; SURFACES; THIN FILMS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON EMISSION; ELEMENTS; EMISSION; ENERGY RANGE; EV RANGE; FILMS; HAFNIUM COMPOUNDS; HEAT TREATMENTS; METALS; PHOTOELECTRIC EFFECT; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SCATTERING; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; SPECTRA; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS