Published April 15, 1991 | Version v1
Journal article

High-resolution electron microscopy analysis of Nd-Fe-B-type sintered magnets

  • 1. Magnetism Laboratory, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China (China)
  • 2. General Research Institute of Non-Ferrous Metals, Beijing, (China)
  • 3. Beijing Analytical and Measurement Centre of Physics and Chemistry, Beijing, (China)

Description

Transmission electron microscopy (TEM) analysis showed that the grain-boundary thin layer is a kind of Nd-rich phase. The high-resolution micrographs of the grain-boundary thin layer were obtained. The lattice constant c of the matrix phase is measured as 12.2 A. The grain-boundary thin layer is coherent with the matrix

Additional details

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
69
Journal Issue
8
Series
J. Appl. Phys.
Journal Page Range
5510-5511
ISSN
0021-8979
CODEN
JAPIA