Surface chemical characterization of PM10 samples by XPS
Creators
- 1. Dipartimento di Scienze Chimiche e Geologiche, Università di Cagliari, Complesso Universitario di Monserrato, S.S. 554 Bivio per Sestu, I-09042 Monserrato, Cagliari (Italy)
- 2. Dipartimento di Chimica, Università degli Studi Milano, Via Golgi 19, I-20133 Milano (Italy)
- 3. Dipartimento di Scienze dell'Ambiente e del territorio, Università degli Studi di Milano-Bicocca, Piazza della Scienza 1, I-20122 Milano (Italy)
- 4. Dipartimento di Fisica, Università degli Studi di Milano, via Celoria 16, I-20133 Milano (Italy)
Description
Samples of particulate matter (PM) collected in the city of Milan during wintertime were analyzed by X-ray photoelectron spectroscopy (XPS), thermal optical transmittance (TOT), ionic chromatography (IC) and X-ray fluorescence (XRF) in order to compare quantitative bulk analysis and surface analysis. In particular, the analysis of surface carbon is here presented following a new approach for the C1s curve fitting aiming this work to prove the capability of XPS to discriminate among elemental carbon (EC) and organic carbon (OC) and to quantify the carbon-based compounds that might be present in the PM. Since surface of urban PM is found to be rich in carbon it is important to be able to distinguish between the different species. XPS results indicate that aromatic and aliphatic species are adsorbed on the PM surface. Higher concentrations of (EC) are present in the bulk. Also nitrogen and sulfur were detected on the surfaces and a qualitative and quantitative analysis is provided. Surface concentration of sulfate ion is equal to that found by bulk analysis; moreover surface analysis shows an additional signal due to organic sulfur not detectable by the other methods. Surface appears to be also enriched in nitrogen.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.03.178Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.03.178;
- PII
- S0169-4332(14)00731-4;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 307
- Journal Page Range
- p. 120-128
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46028995
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABUNDANCE; CARBON; CHROMATOGRAPHY; FLUORESCENCE; IONS; NITROGEN; SULFATES; SULFUR; SURFACES; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; NONMETALS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; RADIATIONS; SEPARATION PROCESSES; SPECTROSCOPY; SULFUR COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.