Afterglow of a microwave microstrip plasma as an ion source for mass spectrometry
Description
A microwave-induced plasma that was previously used for optical emission spectrometry has been repurposed as an afterglow ion source for mass spectrometry. This compact microwave discharge, termed the microstrip plasma (MSP), is operated at 20–50 W and 2.45 GHz in helium at a flow of 300 mL/min. The primary background ions present in the afterglow are ionized and protonated water clusters. An exponential dilution chamber was used to introduce volatile organic compounds into the MSP afterglow and yielded limits of detection in the 40 ppb to 7 ppm range (v/v). A hydride-generation system was also utilized for detection of volatile hydride-forming elements (arsenic, antimony, tin) in the afterglow and produced limits of detection in the 10–100 ppb range in solution. The MSP afterglow was found capable of desorption and ionization of analyte species directly from a solid substrate, suggesting its use as an ion source for ambient desorption/ionization mass spectrometry
Availability note (English)
Available from http://dx.doi.org/10.1016/j.sab.2014.11.004Additional details
Identifiers
- DOI
- 10.1016/j.sab.2014.11.004;
- PII
- S0584-8547(14)00309-7;
Publishing Information
- Journal Title
- Spectrochimica Acta. Part B, Atomic Spectroscopy
- Journal Volume
- 103-104
- Journal Page Range
- p. 43-48
- ISSN
- 0584-8547
- CODEN
- SAASBH
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47055674
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AFTERGLOW; ANTIMONY; ARSENIC; DESORPTION; DILUTION; EMISSION SPECTROSCOPY; GHZ RANGE; HELIUM; HIGH-FREQUENCY DISCHARGES; HYDRIDES; ION SOURCES; IONIZATION; MASS SPECTROSCOPY; MICROWAVE RADIATION; ORGANIC COMPOUNDS; PLASMA; TIN; TRACE AMOUNTS; VOLATILITY
- Descriptors DEC
- ELECTRIC DISCHARGES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; FREQUENCY RANGE; GASES; HYDROGEN COMPOUNDS; METALS; NONMETALS; RADIATIONS; RARE GASES; SEMIMETALS; SORPTION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.