Published January 1, 2010
| Version v1
Journal article
Electronic, structural and magnetic characterization of bulk (ZnO)1-x(MnO2)x system and their PLD synthesized thin films at room temperature
Creators
- 1. Natural Science and Science Education, National Institute of Education, Nanyang Technological University, 637616 Singapore (Singapore)
Description
(ZnO)1-x(MnO2)x thin films for x ≤ 0.07 were deposited by pulsed laser deposition (PLD) at room temperature. Rietveld refinement for XRD of bulk samples confirmed the Mn ions substitution in ZnO lattice as inferred by the change in lattice parameters. The as-deposited thin film samples are found to be polycrystalline with the preferred orientation along (110) diffraction plane. No impurity phase was seen to form in thin film sample. Information about different valance states of doping elements is deduced from XPS data with the help of peak fittings of corresponding core peak observed in XPS survey scan. The deposited (ZnO)1-x(MnO2)x thin films exhibit room temperature ferromagnetism for different compositions.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/200/7/072044Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 200
- Journal Issue
- 7
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- international conference on magnetism
- Acronym
- ICM 2009
- Dates
- 26-31 Jul 2009
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42041722
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRICAL PROPERTIES; ENERGY BEAM DEPOSITION; FERROMAGNETISM; GRAIN ORIENTATION; IMPURITIES; LASER RADIATION; LATTICE PARAMETERS; MAGNETIC PROPERTIES; MANGANESE IONS; MANGANESE OXIDES; PEAKS; POLYCRYSTALS; PULSED IRRADIATION; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTALS; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; FILMS; IONS; IRRADIATION; MAGNETISM; MANGANESE COMPOUNDS; MICROSTRUCTURE; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SPECTROSCOPY; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS