High energy synchrotron X-ray diffraction study of lead oxide silicate glasses at the Canadian light source
- 1. International Center for New-Structured Materials (ICNSM) and Laboratory of New-Structured Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
- 2. Department of Physics and Engineering Physics, University of Saskatchewan, Saskatoon, Saskatchewan, S7N 5E2 (Canada)
- 3. Department of Physics, University of Guelph, Guelph, Ontario, N1G 2W1 (Canada)
- 4. Canadian Light Source Inc., University of Saskatchewan, Saskatoon, Saskatchewan, S7N 0X4 (Canada)
Description
The photon energy operational range of the hard X-ray micro-analysis (HXMA) beamline with X-ray produced from a superconductivity wiggler at the Canadian Light Source is extended to 50 keV to investigate the feasibility of performing total diffraction experiments. Diffraction patterns of lead oxide silicate glasses (PbOxSiO2(1-x)) x=46, 50 and 61 at% were measured. Structures of the glasses were extracted successfully from Fourier transform of the diffraction patterns. It is shown that the extended q range (qmax=14.2 A-1) leads to radial distribution functions (RDFs) with sufficient resolution (0.44 A) to reveal new coordination features. The advantage of high momentum transfer accessible from hard X-ray is clearly demonstrated. Results show that the lead atoms are surrounded by three oxygen and the derived Pb-O-Pb angle ca. 109o supports the existence of -O-(Pb2O2)-O units in the glass structure, which illustrates the capability of the new beamline for the investigation of the structure of disordered solids.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.10.088Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.10.088;
- PII
- S0168-9002(10)02353-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 626-627
- Journal Page Range
- p. 144-146
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42075031
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMS; FOURIER TRANSFORMATION; GLASS; HARD X RADIATION; KEV RANGE 10-100; LEAD; LEAD OXIDES; LIGHT SOURCES; MOMENTUM TRANSFER; OXYGEN; PHOTONS; RESOLUTION; SILICATES; SILICON OXIDES; SOLIDS; SPATIAL DISTRIBUTION; SUPERCONDUCTIVITY; SYNCHROTRONS; X-RAY DIFFRACTION
- Descriptors DEC
- ACCELERATORS; BOSONS; CHALCOGENIDES; COHERENT SCATTERING; CYCLIC ACCELERATORS; DIFFRACTION; DISTRIBUTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; INTEGRAL TRANSFORMATIONS; IONIZING RADIATIONS; KEV RANGE; LEAD COMPOUNDS; MASSLESS PARTICLES; METALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SCATTERING; SILICON COMPOUNDS; TRANSFORMATIONS; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.