Published November 1984 | Version v1
Journal article

Effects of voids at three-grain junctions on sintering and creep damage

  • 1. Lawrence Berkeley Lab., CA

Description

An analysis of the growth and shrinkage rates of ellipsoidal voids on three-grain junctions is presented. The predicted rates are compared with those for cylindrical pores on the same interfaces. It is demonstrated that the sintering of ellipsoidal pores occurs more rapidly, by virtue of the increased surface curvature. The formation of such pores by the Rayleigh instability mechanism thus appears to constitute an important step in final stage sintering. Conversely, under creep loading, cylindrical voids grow at a faster rate, suggesting that creep damage develops more slowly when discrete ellipsoidal voids are maintained on three-grain junctions

Additional details

Publishing Information

Journal Title
J. Am. Ceram. Soc.
Journal Volume
67
Journal Issue
11
Series
J. Am. Ceram. Soc.
Journal Page Range
727-731
ISSN
0002-7820
CODEN
JACTA

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17016093
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CERAMICS; CREEP; DEFECTS; MICROSTRUCTURE; POROSITY; SINTERING; VOIDS
Descriptors DEC
CRYSTAL STRUCTURE; FABRICATION; MECHANICAL PROPERTIES