Published 1978
| Version v1
Miscellaneous
The importance of 1s-vacancies in an explanation of the transient magnetic field
Description
Transient magnetic fields are at present subject to many speculations. Systematics in transient field precession data indicate that the transient field is caused by unpaired s-electrons in the moving ion. In order to test this hypothesis a series of experiments has been started to measure the single - 1s - electron fractions for light ions moving in solids. Measurements have been performed for 10-36 MeV 2γ Si ions in nickel foil targets with a very thin Ti probe layer on one side. The probe layer X-ray yield is very sensitive to 1s vacancies in the beam. The results give strong support to the assumption that bound polarised electrons are responsible for the transient field. (JIW)
Additional details
Publishing Information
- Imprint Title
- Notes from the Nordic spring symposium on atomic inner shell phenomena
- Journal Page Range
- p. 71 - 74.
- Report number
- INIS-mf--5671
Conference
- Title
- Nordic spring symposium on atomic inner shell phenomena.
- Dates
- 17 - 21 Apr 1978.
- Place
- Geilo, Norway.
INIS
- Country of Publication
- Norway
- Country of Input or Organization
- Norway
- INIS RN
- 11532630
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- HOLES; INNER-SHELL IONIZATION; K SHELL; MAGNETIC FIELDS; MEV RANGE 10-100; NICKEL 58 TARGET; PROBES; SILICON 28 BEAMS; SPIN EXCHANGE; SPIN ORIENTATION; TITANIUM; TRANSIENTS; X RADIATION
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY RANGE; ION BEAMS; IONIZATION; IONIZING RADIATIONS; METALS; MEV RANGE; ORIENTATION; RADIATIONS; TARGETS; TRANSITION ELEMENTS
Optional Information
- Notes
- 6 refs.