Published February 1, 2010 | Version v1
Journal article

Heteroepitaxial growth of Fe2Al5 inhibition layer in hot-dip galvanizing of an interstitial-free steel

  • 1. Department of Materials and Optoelectronic Science, Center for Nanoscience and Nanotechnology, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan (China)

Description

This work presents characterization results on inhibition layers formed on a TiNb-stabilized interstitial-free steel after short time galvanizing. The Fe-Al and steel interface was free from oxide, so that the Fe-Al intermetallic compound could directly nucleate on ferrite grains. Electron diffraction performed in a transmission electron microscope showed that only Fe2Al5 was formed and it had a well-defined orientation relationship of [110]Fe(sub/2)Al(sub/5)// [111]Fe, (001)Fe(sub/2)Al(sub/5)//(011)Fe and (110)Fe(sub/2)Al(sub/5)//(211)Fe with Fe substrate. The structure of the interfaces between Fe2Al5 and Fe is discussed. The epitaxially nucleated Fe2Al5 grains on Fe substrate had very small grain size, 20 nm or less, and several variants were intimately mixed. The grains grew rapidly to hundreds of nanometers toward the Zn side.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.07.154

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.07.154;
PII
S0040-6090(09)01289-9;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
518
Journal Issue
8
Journal Page Range
p. 1935-1942
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.