Si(LMM) Auger electron emission from Si alloys by keV Ar+ ion bombardment, new effect and application
- 1. Osaka Univ., Suita (Japan). Faculty of Engineering
Description
Si(LMM) Auger spectra excited by keV ion bombardment were studied in Si alloyed with several elements (Au, Cu, Pd, Ni, C, and H). The spectra differed completely from those of pure Si. The main characteristics are (1) the spectra are composed of two well-separated peaks (88 and 92 eV) called the atomic-like peak (88 eV) and the bulk-like peak (92 eV); and (2) the atomic-like peak is enhanced with respect to the bulk-like peak, and this enhancement becomes more obvious as the concentration of partner elements of the alloys are increased. The possible application of the present phenomena is proposed as a technique for detecting the homogeneity of Si alloy films in the three-dimensional sense - as an example, the three-dimensional distribution of hydrogen in hydrogenated amorphous silicon (a-Si-H). (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys.
- Journal Volume
- 18
- Journal Issue
- 9
- Series
- Jpn. J. Appl. Phys.
- Journal Page Range
- 1767-1772
- ISSN
- 0021-4922
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 11553495
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ARGON IONS; ATOMIC IONS; AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; CATIONS; COPPER BASE ALLOYS; ELECTRON SPECTRA; EV RANGE 01-10; EXPERIMENTAL DATA; FILMS; GOLD BASE ALLOYS; GRAPHS; ION BEAMS; NICKEL BASE ALLOYS; PALLADIUM BASE ALLOYS; SILANES; SILICON; SILICON ALLOYS; SILICON CARBIDES; SPUTTERING
- Descriptors DEC
- ALLOYS; BEAMS; CARBIDES; CARBON COMPOUNDS; CHARGED PARTICLES; COPPER ALLOYS; DATA; DATA FORMS; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY RANGE; EV RANGE; GOLD ALLOYS; HYDRIDES; HYDROGEN COMPOUNDS; INFORMATION; IONS; NICKEL ALLOYS; NUMERICAL DATA; PALLADIUM ALLOYS; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS