Published March 31, 2006
| Version v1
Journal article
The effect of adsorbed noble gas atoms on muonium formation at the silica surface
- 1. Department of Physics, University of Wales Swansea, Swansea SA2 8PP (United Kingdom)
- 2. ISIS, Rutherford Appleton Laboratory, Chilton, Oxfordshire OX 11 0QX (United Kingdom)
- 3. ISIS, Rutherford Appleton Laboratory, Chilton, Oxfordshire OX 11 0QX (United Kingdom) and Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT (United Kingdom)
Description
Muonium formation on a silica powder surface has been studied while films of noble gases up to a monolayer thickness covered the surface of the powder grains. The fraction of muons stopped in the powder that formed muonium was found to decrease as the surface coverage increased for all the gases investigated. This has enabled muonium formation in the bulk, and at the surface of the grains, to be distinguished and provided the first direct evidence for the formation of muonium atoms at the surface of an insulator
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.11.094;
- PII
- S0921-4526(05)01305-0;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 374-375
- Journal Page Range
- p. 355-358
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 10. international conference on muon spin rotation, relaxation and resonance
- Dates
- 8-12 Aug 2005
- Place
- Oxford (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37073014
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FILMS; MUON SPIN RELAXATION; MUONIC ATOMS; MUONIUM; MUONS; POWDERS; RARE GASES; SILICA; SURFACES; THICKNESS
- Descriptors DEC
- ATOMS; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FLUIDS; GASES; LEPTONS; MINERALS; NONMETALS; OXIDE MINERALS; RELAXATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.