Published 1981
| Version v1
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Background fitting for electron energy-loss spectra
Description
Microanalysis using electron energy loss spectroscopy is now well established. In order to assess true edge profiles and obtain integrated intensities of the inner shell ionization edges of interest, it is first necessary to subtract the background. Usually a simple inverse power law is used, but for some spectra this form does not fit well. An alternative form which results in superior fits is described
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.Files
12637268.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 8 p.
- Report number
- CONF-810740--1
Conference
- Title
- 3. analytical electron microscopy workshop.
- Dates
- 13 - 17 Jul 1981.
- Place
- Vail, CO, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12637268
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND NOISE; BINDING ENERGY; CERAMICS; ELECTRON MICROPROBE ANALYSIS; ELECTRON MICROSCOPES; ELECTRON SPECTROSCOPY; ELECTRONS; ENERGY LOSSES; INNER-SHELL IONIZATION; MAGNETIC SPECTROMETERS; NICKEL; PHOTOMULTIPLIERS; TITANIUM BORIDES
- Descriptors DEC
- BORIDES; BORON COMPOUNDS; CHEMICAL ANALYSIS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY; FERMIONS; IONIZATION; LEPTONS; MEASURING INSTRUMENTS; METALS; MICROSCOPES; NOISE; NONDESTRUCTIVE ANALYSIS; PHOTOTUBES; SPECTROMETERS; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS