Published 1997
| Version v1
Book
Dynamic effects at multiwave X-ray diffraction on InGaP/GaAs(111) heterostructure
- 1. Inst. Kristallografii RAN, Moscow (Russian Federation)
Description
The dynamic multiwave X-ray diffraction is investigated on the In0.5Ga0.5P/GaAs(111) heteroepitaxial structure. The thickness of the epitaxial film is 0.5 μm. The dependences of the reflection coefficient on the azimuth angle are measured for the GaAs(111) ideal crystal and the InGaP/GaAs heterostructure. The experimental results are compared with the theoretical data. The difference between theoretical and experimental data is explained by the effect of the hybrid diffraction or the diffraction in the film of the beam scattered in the substrate
Abstract (Russian)
Исследуется динамическая многоволновая дифракция рентгеновских лучей от гетероэпитаксиальной структуры In0.5Ga0.5P/GaAs(111). Толщина эпитаксиальной пленки 0.5 мкм. Измерены зависимости коэффициента отражения от азимутального угла для идеального кристалла GaAs(111) и гетероструктуры InGaP/GaAs. Экспериментальные данные сравниваются с теоретическими. Расхождение между экспериментальными и теоретическими данными объясняются эффектом гибридной дифракции или дифракцией в пленке пучка, рассеянного в подложкеAdditional details
Additional titles
- Original title (Russian)
- Динамические эффекты при многоволновой дифракции рентгеновских лучей на InGaP/GaAs(111) гетероструктуре
Publishing Information
- Publisher
- OIYaI
- Imprint Place
- Dubna (Russian Federation)
- ISBN
- 5-85165-483-X
- Imprint Title
- National conference on the application of X-rays, synchrotron radiation, neutrons and electrons for materials study (the continuation of All-Union Meetings on the application of X-rays for materials research). Summary of reports. Volume 3
- Imprint Pagination
- 370 p.
- Journal Page Range
- p. 129-133
Conference
- Title
- National conference on the application of X-rays, synchrotron radiation, neutrons and electrons for materials study (the continuation of All-Union Meetings on the application of X-rays for materials research)
- Original Conference Title
- Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov)
- Dates
- 25-29 May 1997
- Place
- Dubna (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 33025840
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; DEBYE-WALLER FACTOR; GALLIUM ARSENIDES; GALLIUM PHOSPHIDES; HETEROJUNCTIONS; INDIUM PHOSPHIDES; NUMERICAL DATA; REFLECTION; X-RAY DIFFRACTION
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; DATA; DIFFRACTION; EVALUATION; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; INFORMATION; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SCATTERING; SEMICONDUCTOR JUNCTIONS
Optional Information
- Notes
- 7 refs., 3 figs. Imprint:Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov). Sbornik dokladov. Tom 3
- Secondary number(s)
- JINR-R--14-97-343