Hyperfine Fields of Light Interstitial Impurities in Ni
- 1. University of Munich, Depatment of Chemistry (Germany)
- 2. Osaka University (Japan)
- 3. Institute fuer Festkoerperforschung, Forschungszentrum Juelich (Germany)
Description
The magnetic hyperfine interaction of light interstitial impurities in Ni have been studied by means of the Korringa-Kohn-Rostoker (KKR) band structure method. This method allows to deal with the impurity problem by solving the corresponding Dyson equation for the Green's function. It also allows to account for lattice relaxations. For this purpose a new technique was developed that allows to handle in principle arbitrary lattice distortions. Corresponding calculations have been performed for the magnetic hyperfine fields of the light interstitial impurities H to Ne in Ni. By minimising the force on the nearest neighbour host atoms their equilibrium position was determined. The resulting hyperfine fields for the equilibrium configuration are found to be in rather good agreement with available experimental data.
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 158
- Journal Issue
- 1-4
- Journal Page Range
- p. 59-62
- ISSN
- 0304-3843
- CODEN
- HYINDN
Conference
- Title
- 13. international conference on hyperfine interactions; 17. international symposium on nuclear quadrupole interactions
- Acronym
- HFI/NQI 2004
- Dates
- 22-27 Aug 2004
- Place
- Bonn (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43027843
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; CONFIGURATION; EQUATIONS; EQUILIBRIUM; GREEN FUNCTION; HYPERFINE STRUCTURE; IMPURITIES; INTERACTIONS; INTERSTITIALS; NICKEL; RELAXATION
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; FUNCTIONS; METALS; POINT DEFECTS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Springer Science+Business Media, Inc.