Published February 15, 1978
| Version v1
Journal article
Surface analysis by argon ion induced X-ray fluorescence
Creators
- 1. Strasbourg-1 Univ., 67 (France). Centre de Recherches Nucleaires
Description
In heavy ion-atom collisions electron promotion via quasimolecular orbitals enhances the ionization of the target atoms having electronic levels slightly higher than those of the projectile. Ar ions induce the X-ray emission of elements with K, L or M shell energies below 3.2 keV. The application of this phenomenon to surface analysis with Ar+ and Ar++ ions, accelerated up to 3 MV is discussed. (Auth.)
Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods
- Journal Volume
- 149
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 483-488
- ISSN
- 0029-554X
Conference
- Title
- 3. international conference on ion beam analysis.
- Dates
- 27 Jun - 1 Jul 1977.
- Place
- Washington, D.C., USA.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 9385432
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; ION-ATOM COLLISIONS; IONIZATION; K SHELL; L SHELL; M SHELL; MEV RANGE 01-10; MULTI-ELEMENT ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; SILICON; TRACE AMOUNTS; TRANSITION ELEMENTS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- ATOM COLLISIONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; COLLISIONS; ELECTRONIC STRUCTURE; ELEMENTS; ENERGY RANGE; ION COLLISIONS; IONS; METALS; MEV RANGE; NONDESTRUCTIVE ANALYSIS; SEMIMETALS; SPECTRA; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent