Controlling the orientation of ZnO nanorod arrays using TiO2 thin film templates dip-coated by sol-gel
Creators
- 1. Qingdao University of Science and Technology, Key Laboratory of Nanomaterials (China)
Description
The oriented ZnO nanorod arrays have been synthesized on a silicon wafer that coated with TiO2 films by aqueous chemical method. The morphologies, phase structure and the photoluminescence (PL) properties of the as-obtained product were investigated by field-emission scanning electron microscopy (FE-SEM), X-ray diffractometer (XRD), transmission electron microscope (TEM) and PL spectrum. The nanorods were about 100 nm in diameter and more than 1 μm in length, which possessed wurtzite structure with a c axis growth direction. The room-temperature PL measurement of the nanorod arrays showed strong ultraviolet emission. The effect of the crystal structure and the thickness of TiO2 films on the morphologies of ZnO nanostructures were investigated. It was found that the rutile TiO2 films were appropriate to the oriented growth of ZnO nanorod arrays in comparison with anatase TiO2 films. Moreover, flakelike ZnO nanostructures were obtained with increasing the thickness of anatase TiO2 films
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nanoparticle Research
- Journal Volume
- 9
- Journal Issue
- 2
- Journal Page Range
- p. 245-250
- ISSN
- 1388-0764
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39094356
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL STRUCTURE; FIELD EMISSION; MORPHOLOGY; NANOSTRUCTURES; PHOTOLUMINESCENCE; RUTILE; SCANNING ELECTRON MICROSCOPY; SILICON; SOL-GEL PROCESS; SPECTRA; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; FILMS; LUMINESCENCE; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SCATTERING; SEMIMETALS; TEMPERATURE RANGE; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Springer Science+Business Media, Inc.