Published January 2001 | Version v1
Journal article

Investigation of junction area of Pb1-xSnxTe/PbTe1-ySey heterostructures

  • 1. Institute of photoelectron of Azerbaijan National Academy of Sciences, Baku (Azerbaijan)

Description

In present work the dependence of parameters of junction area on composition of top layer of hetero structure Pb1-xSnxTe/PbTe1-ySey prepared by a method molecular-beam-epitaxy was investigated. By the methods of asymptotical Bregg diffractometry have been determined thickness of a junction layer, deformation and static Debye-Waller factor. The calculations are carried out in kinematic approximation, allowed to obtain profile of distribution of deformation and static Debye-Waller factor in these structures

Additional details

Additional titles

Original title (Russian)
Рентгенодифракционное исследование переходного слоя гетероструктур Пб

Publishing Information

Journal Title
Fizika (Baku)
Journal Volume
7
Journal Issue
1
Journal Page Range
p. 38-39
ISSN
1028-8546

INIS

Country of Publication
Azerbaijan
Country of Input or Organization
Azerbaijan
INIS RN
35024649
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DEBYE-WALLER FACTOR; DEFORMATION; DIFFRACTOMETERS; MOLECULAR BEAM EPITAXY; THICKNESS
Descriptors DEC
CRYSTAL GROWTH METHODS; DIMENSIONS; EPITAXY; MEASURING INSTRUMENTS

Optional Information

Notes
8 refs., 1 tab., 1 fig.