Published January 2001
| Version v1
Journal article
Investigation of junction area of Pb1-xSnxTe/PbTe1-ySey heterostructures
Creators
- 1. Institute of photoelectron of Azerbaijan National Academy of Sciences, Baku (Azerbaijan)
Description
In present work the dependence of parameters of junction area on composition of top layer of hetero structure Pb1-xSnxTe/PbTe1-ySey prepared by a method molecular-beam-epitaxy was investigated. By the methods of asymptotical Bregg diffractometry have been determined thickness of a junction layer, deformation and static Debye-Waller factor. The calculations are carried out in kinematic approximation, allowed to obtain profile of distribution of deformation and static Debye-Waller factor in these structures
Additional details
Additional titles
- Original title (Russian)
- Рентгенодифракционное исследование переходного слоя гетероструктур Пб
Publishing Information
- Journal Title
- Fizika (Baku)
- Journal Volume
- 7
- Journal Issue
- 1
- Journal Page Range
- p. 38-39
- ISSN
- 1028-8546
INIS
- Country of Publication
- Azerbaijan
- Country of Input or Organization
- Azerbaijan
- INIS RN
- 35024649
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEBYE-WALLER FACTOR; DEFORMATION; DIFFRACTOMETERS; MOLECULAR BEAM EPITAXY; THICKNESS
- Descriptors DEC
- CRYSTAL GROWTH METHODS; DIMENSIONS; EPITAXY; MEASURING INSTRUMENTS
Optional Information
- Notes
- 8 refs., 1 tab., 1 fig.