Published 1992
| Version v1
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Optical and structural characteristics of lead sulfides thin films
- 1. Technology University of Malaysia (Malaysia)
- 2. Keele Univ. (United Kingdom)
Description
Tin sulfide films have been prepared by evaporation technique at 1x10-4 torr and at substrate temperatures between 100 to 3000C. The films thickness were 52 to 370 nm. From the absorption 1.47 eV and X-ray diffraction patent shows that the composition of films have changed from SnS2 (at low temperature) to SnS (at higher temperature)
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Additional details
Additional titles
- Original title (Malay)
- Sifat optik dan struktur saput tipis timah sulfida
Publishing Information
- Imprint Pagination
- 5 p.
- Report number
- INIS-mf--13893
Conference
- Title
- 9. Seminar on solid state science.
- Dates
- 2-3 Nov 1992.
- Place
- Johor Bahru (Malaysia).
INIS
- Country of Publication
- Malaysia
- Country of Input or Organization
- Malaysia
- INIS RN
- 25043451
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- OPTICAL PROPERTIES; THIN FILMS; TIN SULFIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; FILMS; PHYSICAL PROPERTIES; SCATTERING; SULFIDES; SULFUR COMPOUNDS; TIN COMPOUNDS