Published February 1982 | Version v1
Report Restricted

Automated system for ion beam analysis and temperature ramping

Description

An automated system has been developed to perform ion beam analysis with in situ temperature programming from approx. 120K to approx. 770K

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A03/MF A01 as DE82013634.

Files

Restricted

The record is publicly accessible, but files are restricted to users with access.

Additional details

Publishing Information

Imprint Pagination
30 p.
Report number
SAND--82-0334