Published 1997 | Version v1
Book Metadata-only

Search for the optimal thicknesses of the samples for the low-level gamma-ray spectrometry measurements

Creators

  • 1. Department of Nuclear Physics, Faculty of Mathematics and Physics, Comenius University, 842 15 Bratislava (Slovakia)

Description

In this work the results of the search of the optical thicknesses of the large-volume samples for the measurements in low-level gamma-ray spectrometry are presented. The optimal thicknesses of the samples were obtained for single HPGe-Nal(TI) spectrometers. (authors)

Availability note (English)

Availability from the Library, Faculty of Mathematics and Physics, Comenius University, Mlynska dolina, SK-842 15 Bratislava, Slovak Republic

Additional details

Additional titles

Original title (English)
Acta Physica Universitatis Comenianae

Publishing Information

Publisher
Comenius University Press Bratislava
Imprint Place
Bratislava (Slovakia)
ISBN
80-223-1170-7
Imprint Title
Physics Letters Comenius University
Imprint Pagination
119 p.
Journal Volume
38
Journal Issue
1,2
Series
Acta Physica Universitatis Comenianae
Journal Page Range
p. 69-72

INIS

Country of Publication
Slovakia
Country of Input or Organization
Slovakia
INIS RN
30017461
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
EMISSION; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; LOW-LEVEL RADIOACTIVE WASTES; SPECTROSCOPY; THICKNESS
Descriptors DEC
DIMENSIONS; GE SEMICONDUCTOR DETECTORS; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIOACTIVE MATERIALS; RADIOACTIVE WASTES; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; WASTES

Optional Information

Notes
2 refs.; 1 fig.; 3 tabs. Imprint:Acta Physica Universitatis Comenianae