Published January 1, 2005 | Version v1
Journal article

Approximation of surface texture profiles

  • 1. School of Computing and Engineering, University of Huddersfield (United Kingdom)
  • 2. Division of Engineering and Process Control, National Physical Laboratory (United Kingdom)
  • 3. Mathematics and Scientific Software Group, National Physical Laboratory (United Kingdom)

Description

In this paper we are interested in the approximation of continuous surface texture profiles defined only at discretely obtained points. A continuous representation is required in order to be able to apply filtration methods that assume uniform data spacing to practical data that in general is not uniformly spaced. By reconstructing surface profiles as natural cubic spline interpolants accurately using numerically stable fitting algorithms, we can provide a mathematically sound basis on which to compute surface texture profile parameters. As an important direct benefit, parameters involving the integrals of surface profiles can be calculated directly from the spline interpolant. Examples are given to illustrate the advantages of using this reconstruction method

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/13/264/jpconf5_13_062.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
13
Journal Issue
1
Journal Page Range
p. 264-267
ISSN
1742-6596

Conference

Title
7. international symposium on measurement technology and intelligent instruments
Dates
6-8 Sep 2005
Place
Huddersfield (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36111566
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; FILTRATION; MEASURING METHODS; SURFACES; TEXTURE
Descriptors DEC
MATHEMATICAL LOGIC; SEPARATION PROCESSES