Published March 2006
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Preparation of Ta Te2 thin films by laser ablation
Creators
- 1. Atomic Energy Commission, Damascus (Syrian Arab Republic), Dept. of Physics
- 2. Atomic Energy Commission, Damascus (Syrian Arab Republic), Dept. of Chemistry
Description
The laser ablation system consisting of a vacuum chamber and Nd-YAG laser has been built for deposition TaTe2 on three different substrates (Silicon, glass, and Aluminium). The surface topography of the prepared thin films has been studied by atomic force microscopy (AFM). TaTe2 powder was characterized by using x-ray diffraction. The crystallinity of the thin films was examined by x-ray diffraction (XRD). The results show no peaks corresponding TaTe2, but there are some indications to the Ta3N5. (author)
Availability note (English)
Available from INIS in electronic formFiles
37112796.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 14 p.
- Report number
- AECS-PH/RRE--160
INIS
- Country of Publication
- Syrian Arab Republic
- Country of Input or Organization
- Syrian Arab Republic
- INIS RN
- 37112796
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Is Lead record
- Yes
- Descriptors DEI
- ABLATION; ALUMINIUM; ATOMIC FORCE MICROSCOPY; DEPOSITION; EXPERIMENTAL DATA; GLASS; NEODYMIUM LASERS; SILICON; SURFACES; TANTALUM NITRIDES; TANTALUM TELLURIDES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DATA; DIFFRACTION; ELEMENTS; FILMS; INFORMATION; LASERS; METALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NUMERICAL DATA; PNICTIDES; REFRACTORY METAL COMPOUNDS; SCATTERING; SEMIMETALS; SOLID STATE LASERS; TANTALUM COMPOUNDS; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- 9 refs., 9 figs., 2 tabs.