A new class of Wiener process models for degradation analysis
Creators
- 1. Department of Industrial and Systems Engineering, National University of Singapore (Singapore)
- 2. Department of Statistics, School of Economics, Xiamen University (China)
Description
For many products, it is not uncommon to see that a unit with a higher degradation rate has a more volatile degradation path. Motivated by this observation, we propose a new class of random effects model for the Wiener process model. We express the Wiener process in a special form and allow one of the parameters to be random across the product population so that a unit with a high degradation rate would also possess high volatility. Statistical inference of the model is discussed. By the same token, we introduce a stress–acceleration relation for the Wiener process so that both the degradation rate and the volatility of the product are increasing in the stress level. The proposed models are demonstrated by analyzing a dataset of fatigue crack growth and a dataset of head wears of hard disk drives. The applications suggest that our models perform better than existing models that ignore the positive correlation between the drift rate and the volatility. - Highlights: • We propose a new Wiener process to capture dependence between mean and variance. • Random-effects Wiener process models are developed so that the variance is increasing in the degradation mean. • Stress are incorporated into the process in a similar way. • Statistical inference methods are also developed. • The methods are applied to two real examples
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ress.2015.02.005Additional details
Identifiers
- DOI
- 10.1016/j.ress.2015.02.005;
- PII
- S0951-8320(15)00050-2;
Publishing Information
- Journal Title
- Reliability Engineering and System Safety
- Journal Volume
- 138
- Journal Page Range
- p. 58-67
- ISSN
- 0951-8320
- CODEN
- RESSEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47019585
- Subject category
- S42: ENGINEERING; S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- ALGORITHMS; CRACK PROPAGATION; DATASETS; FATIGUE; MAGNETIC DISKS; RANDOMNESS; STATISTICS; STRESS ANALYSIS; STRESSES; VOLATILITY
- Descriptors DEC
- DOCUMENT TYPES; MAGNETIC STORAGE DEVICES; MATHEMATICAL LOGIC; MATHEMATICS; MECHANICAL PROPERTIES; MEMORY DEVICES
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.