Published July 16, 1987
| Version v1
Journal article
Calculation of bulk charge and electric field profiles in one-open-face coaxial γ-detectors using experimental C-U characteristics
- 1. AN Ukrainskoj SSR, Kiev. Inst. Yadernykh Issledovanij
Description
Experimental C-U characteristics of one-open-face coaxial detectors are employed in deriving an analytic expression that describes the distributions of ionized impurity bulk charge e(Na - Nd) and electric field E(r) for arbitrary variations of Na - Nd in the detector volume. As an example, e(Na - Nd) = f(r) and E(r) are calculated for a Ge(Li)-detector whose experimental C-U characteristics is approximated by a power law with exponent two. (author)
Additional details
Publishing Information
- Journal Title
- Phys. Status Solidi A
- Journal Volume
- 102
- Journal Issue
- 1
- Series
- Phys. Status Solidi A.
- Journal Page Range
- 315-319
- ISSN
- 0031-8965
- CODEN
- PSSAB
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 18095799
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANALYTICAL SOLUTION; CAPACITANCE; CARRIER DENSITY; ELECTRIC CHARGES; ELECTRIC FIELDS; GAMMA DETECTION; IMPURITIES; LI-DRIFTED GE DETECTORS; RADIATION DETECTORS; SPATIAL DISTRIBUTION; SPHERICAL CONFIGURATION
- Descriptors DEC
- CONFIGURATION; DETECTION; DISTRIBUTION; ELECTRICAL PROPERTIES; GE SEMICONDUCTOR DETECTORS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTION; SEMICONDUCTOR DETECTORS