Observation of interference fringes due to lattice distortion by resonant scattering X-ray topography

The interference fringe caused by lattice distortion around a defect is observed in the resonant scattering X-ray topography for the GaAs 200 reflection in the Laue case. The amplitude of the fringe can be maximized when the Fourier transform of the imaginary part of X-ray polarizability χhi is zero. The fringe position relative to the defect shifts when the incident angle is varied, and the fringe spacing changes as a function of the distance from the defect. A kinematical image can be distinguished from a dynamical one by observing the image position when the incident angle is varied in the case of χhi=0. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)