Published August 1, 2003 | Version v1
Journal article

Complex x-ray holography

  • 1. Department of Materials Science, Graduate School of Engineering, Tohoku University, Aoba-yama 02, Sendai 980-8579 (Japan)
  • 2. Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980-8577 (Japan)

Description

We propose a complex x-ray holography that enables us to completely record phases of scattering x rays using resonant x-ray scattering. Its feasibility was verified by a simulation. Complex holograms were derived from hologram patterns around Ga with three incident energies near the As K absorption edge in GaAs. Distortion and/or artifacts in reconstructed image of As atoms around Ga were quite depressed. This holography method, in combination with resonant x-ray scattering, provides us both element identification in real space and a solution of a twin-image problem

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
68
Journal Issue
5
Journal Page Range
p. 052103-052103.4
ISSN
1098-0121

Optional Information

Notes
(c) 2003 The American Physical Society