Published 1990
| Version v1
Book
Simulation study of applied-B ion diodes with plasma prefill
Description
The prefilling of an ion diode with plasma can establish an electron distribution in the diode that allows ion flow well above the Child-Langmuir limit in a very short time compared to the pulse length. This idea has previously been proposed and studied both experimentally and theoretically. In the present study, primarily using the relativistic, electromagnetic, 2.5-D PIC code MAGIC, the process is examined in detail with a realistic diode configuration to help quantitatively define plasma-filled ion diode experiments
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- 1990 IEEE international conference on plasma science-Conference Record-Abstracts
- Imprint Pagination
- 231 p.
- Journal Page Range
- p. 217.
Conference
- Title
- 17. IEEE international conference on plasma science (ICOPS 17).
- Dates
- 21-23 May 1990.
- Place
- Oakland, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22052877
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; COMPUTER CODES; DISTRIBUTION FUNCTIONS; ELECTROMAGNETISM; ELECTRONS; INHOMOGENEOUS PLASMA; ION BEAMS; PLASMA DENSITY; PULSES; RELATIVISTIC RANGE; SATURATION; SIMULATION; THERMIONIC DIODES
- Descriptors DEC
- BEAMS; DIODE TUBES; ELECTRON TUBES; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; LEPTONS; MAGNETISM; PLASMA; THERMIONIC TUBES
Optional Information
- Secondary number(s)
- CONF-900585--.