XPS, XRD and SEM characterization of a thin ceria layer deposited onto graphite electrode for application in lithium-ion batteries
Creators
- 1. Laboratoire de Physico-Chimie des Surfaces, CNRS UMR 7045, Ecole Nationale Superieure de Chimie de Paris (Chimie ParisTech), 11 Rue Pierre et Marie Curie, 75005 Paris (France)
- 2. Laboratoire d'Electrochimie, Chimie des Interfaces et Modelisation pour l'Energie, CNRS UMR 7575, Ecole Nationale Superieure de Chimie de Paris (Chimie ParisTech), 11 Rue Pierre et Marie Curie, 75005 Paris (France)
Description
Thin ceria layer deposited by electro-precipitation onto graphite was synthesised and characterized by X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The electro-precipitated ceria has a cubic structure with nanocrystallites of about 6 nm. The SEM analyses shows that the ceria layer reflects the morphology of the graphite electrode, exhibits small cracks usually found on the electro-precipitated films but covers almost completely the surface of the graphite. The ceria layer is composed of 75% Ce(IV) and 25% Ce(III) oxides as indicated by the XPS analyses. Cyclic voltammetry and galvanostatic charge-discharge tests in ethylene carbonate/dimethyl carbonate (1/1) (wt/wt) in the presence of 1 M LiPF6 show that reversible lithium insertion and deinsertion occurs in the graphite/ceria electrode and that the ceria layer on the graphite electrode prevents from the loss of capacity during the first four cycles. The reduction of the electrolyte occurs at about 0.7 V vs Li/Li+ on both electrodes but XPS and SEM analyses show that the SEI layer is thin and not as homogenous on the graphite as on the graphite/ceria electrode. The composition of the SEI layer on the graphite/ceria electrode, mainly composed of Li2CO3, ROCO2Li, R-CH2OLi and LiF, is different than those obtained on the graphite.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2011.05.108Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2011.05.108;
- PII
- S0169-4332(11)00820-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 21
- Journal Page Range
- p. 9110-9119
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44025159
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANODES; CAPACITY; CERIUM OXIDES; ELECTRIC BATTERIES; ETHYLENE; GRAPHITE; LAYERS; LITHIUM CARBONATES; LITHIUM FLUORIDES; LITHIUM IONS; LOSSES; MODIFICATIONS; PRECIPITATION; SCANNING ELECTRON MICROSCOPY; SOLID ELECTROLYTES; SURFACES; THIN FILMS; VOLTAMETRY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKENES; CARBON; CARBON COMPOUNDS; CARBONATES; CERIUM COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTROCHEMICAL CELLS; ELECTRODES; ELECTROLYTES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY STORAGE SYSTEMS; ENERGY SYSTEMS; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HYDROCARBONS; IONS; LITHIUM COMPOUNDS; LITHIUM HALIDES; MICROSCOPY; MINERALS; NONMETALS; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RARE EARTH COMPOUNDS; SCATTERING; SEPARATION PROCESSES; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.