Published June 5, 2014 | Version v1
Journal article

Impedance spectroscopy study of SiO2–Li2O:Nd2O3 glasses

  • 1. LACANM – Laboratório de Caracterização em Novos Materiais – UFMT, 78060-900 Cuiabá, MT (Brazil)
  • 2. Departamento de Física, Universidade Federal do Ceará, Campus do PICI, Caixa Postal 6030, 60455-760 Fortaleza, CE (Brazil)
  • 3. ORNL Center for Radiation Detection Materials and Systems and ORNL Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6044 (United States)

Description

Highlights: • Neodymium-doped lithium silicate glasses by the conventional melt-quenching technique. • Complex impedance have been used to analyze the electrical and dielectric properties. • The modulus curves show a non-Debye behavior. - Abstract: In the present study, neodymium-doped lithium silicate glasses have been prepared by the conventional melt-quenching technique. The dielectric properties, electric modulus, and electrical conductivity of SiO2–Li2O (SiLi–0Nd) and SiO2–Li2O:Nd2O3 (SiLi-1.35Nd) have been studied from 1 Hz to 1 MHz in the 333–423 K temperature range. At a given temperature and frequency, we observe that the conductivity decreases when neodymium ions are added to the glass matrix. The activation energy of two distinct regions was evaluated from the ln(σdc) = f(1/T) plot and was found to be E1 (T < 363 K) = 0.61(0.66) eV and E2 (T > 363 K) = 1.26(1.09) eV for SiLi–0Nd (SiLi–1.35Nd). The dielectric constant (εRe) decreases while the dielectric loss (tan (δ)) increases under Nd2O3 doping. We also observe that for both glasses, εRe and tan (δ) tend to increase with increasing temperature and decrease with increasing frequency

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2014.01.151

Additional details

Identifiers

DOI
10.1016/j.jallcom.2014.01.151;
PII
S0925-8388(14)00197-2;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
597
Journal Page Range
p. 79-84
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.