Published 1992 | Version v1
Journal article

Chips in space

Creators

  • 1. Cornell Univ., Ithaca, NY (United States). Dept. of Nuclear Science and Engineering

Description

Microelectronic components that would function reliably at ground level may fail, with disastrous consequences, when used in a spacecraft or communications satellite. Outside the earth's atmosphere, ionizing radiation can make minute electronically active structures perform unreliably or break down completely. This paper reports that together with a team of graduate students, the author is investigating the fundamental mechanisms by which energetic radiation affects the behavior of microelectronic structures. Their approach involves three steps, each of which plays an essential role in the development of radiation-tolerant devices. First, they investigate the characteristics of relevant radiation sources, then they examine the way in which radiation interacts with the materials employed in particular electronic devices, and finally, they measure and interpret the response of these devices to the radiation field. The effort is interdisciplinary, involving nuclear science, space science, solid-state physics, and microelectronics

Additional details

Additional titles

Subtitle (English)
Developing microelectronic structures that tolerate ionizing radiation

Publishing Information

Journal Title
Engineering, Cornell Quarterly
Journal Volume
26
Journal Issue
3
Journal Page Range
p. 39-43.
ISSN
0013-7871
CODEN
ECQUAU

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
24019740
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
Descriptors DEI
IONIZATION; MICROELECTRONIC CIRCUITS; MICROELECTRONICS; RADIATION EFFECTS; RELIABILITY; SPACE; TOLERANCE
Descriptors DEC
ELECTRONIC CIRCUITS