Published December 2009
| Version v1
Journal article
Analysis of the periodicity of voltage versus applied flux curves of planar and three-dimensional SQUIDs in the presence of coupling inhomogeneity
Description
Coupling inhomogeneities in the Josephson junctions of planar 0-SQUIDs and π-SQUIDs and of three-dimensional SQUIDs are considered. Starting from the properties of planar SQUIDs, it is shown that slight non-homogeneous couplings of the twelve junctions in three-dimensional superconducting interferometers do not affect the periodicity properties of voltage versus applied flux curves. The results are obtained by applying a rigorous and general analytic approach to planar and three-dimensional superconducting devices.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-2048/22/12/125010Additional details
Identifiers
- DOI
- 10.1088/0953-2048/22/12/125010;
- PII
- S0953-2048(09)23287-8;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 22
- Journal Issue
- 12
- Journal Page Range
- [6 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42053348
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRIC POTENTIAL; INTERFEROMETERS; JOSEPHSON JUNCTIONS; PERIODICITY; SQUID DEVICES; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS; VARIATIONS