Published September 22, 2004 | Version v1
Journal article

Accumulative roll-bonding: first experience with a twin-roll cast AA8006 alloy

Description

An ultra-fine grained (UFG) material was prepared from a twin-roll cast (TRC) Al-Fe-Mn-Si (AA8006) sheet using accumulative roll-bonding (ARB) process. After initial failures to achieve good sheet bonding, five cycles of ARB at 200 deg. C were successfully performed. Scanning electron microscopy (Electron Backscatter Diffraction) and transmission electron microscopy (TEM) were used for the characterization of subgrain and grain structures of ARB processed samples. The strength of ARB sheets was evaluated by microhardness measurements. Very fine grain structure (0.4-0.8 μm) with large disorientation was observed after two cycles of ARB. In two samples, areas with extremely fine grains 0.1-0.3 μm in diameter were found. The hardness of the alloy increased from 28 to 60 HV1 after the first two cycles, but during subsequent ARB processing it rose only very slightly

Additional details

Identifiers

DOI
10.1016/j.jallcom.2003.10.082;
PII
S0925838804001240;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
378
Journal Issue
1-2
Journal Page Range
p. 322-325
ISSN
0925-8388
CODEN
JALCEU

Conference

Title
9. international symposium on physics of materials
Acronym
ISPMA 9
Dates
1-4 Sep 2003
Place
Prague (Czech Republic)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37028726
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM ALLOYS; DIFFRACTION; FAILURES; IRON ALLOYS; MANGANESE ALLOYS; MICROHARDNESS; SCANNING ELECTRON MICROSCOPY; SHEETS; SILICON ALLOYS; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOYS; COHERENT SCATTERING; ELECTRON MICROSCOPY; HARDNESS; MECHANICAL PROPERTIES; MICROSCOPY; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.