Study of electron optics in an electron beam ion charge breeding source
Description
Charge state of an ion can precisely be tuned in an Electron Bean Ion-charge Breeding Source (EBIBS) and further the highly pure beam of common or rare species can be extracted for various applications in medical, material, atomic, nuclear and other science and engineering. It has been envisaged that the ion source under study will be highly beneficial for the rare isotope project at our centre. An EBIBS essentially consists of a high perveance electron gun to generate electron beam up to >10A using proper design and a superconducting solenoid of ∼1.2m length and ∼5T axial magnetic field and a water cooled electron collector and ion extractor chamber. It is very important to study the electron beam optics throughout the source for smooth transmission and compatible design of subsystems. The gun will be using cathode, which will project axially high current beam under magnetic field. A large number of thin combined electric and magnetic lenses have been modelled to study the individual projected electrons as well as whole electron beam throughout the length with and without space charge effect. The electron optical details are presented. (author)
Additional details
Publishing Information
- Publisher
- Variable Energy Cyclotron Centre
- Imprint Place
- Kolkata (India)
- Imprint Title
- Proceedings of the Indian particle accelerator conference
- Imprint Pagination
- 892 p.
- Journal Page Range
- p. 840-842
Conference
- Title
- 6. Indian particle accelerator conference
- Acronym
- InPAC-2013
- Dates
- 19-22 Nov 2013
- Place
- Kolkata (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 45086966
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; ECR ION SOURCES; ELECTRON BEAMS; ELECTRON GUNS; MAGNETIC FIELDS; SUPERCONDUCTING MAGNETS
- Descriptors DEC
- BEAMS; ELECTRICAL EQUIPMENT; ELECTROMAGNETS; EQUIPMENT; ION SOURCES; LEPTON BEAMS; MAGNETS; PARTICLE BEAMS; SUPERCONDUCTING DEVICES
Optional Information
- Notes
- 10 refs., 4 figs., 1 tab.