Published January 2010 | Version v1
Journal article

Signal processing method of a laser synthetic wavelength interferometer

  • 1. Nanometer Measurement Lab, Zhejiang Sci-tech University, Hangzhou 310018 (China)
  • 2. Department of Precision Instruments, Tsinghua University, Beijing 100084 (China)
  • 3. School of Science, Zhejiang Sci-tech University, Hangzhou 310018 (China)

Description

A laser synthetic wavelength interferometer that uses a large synthetic wavelength to subdivide fringes formed by a small single wavelength is described. This study emphasizes the interference signal processing for the interferometer to realize precision measurement. A novel fringe counting method of correcting the integer number of the interference fringe according to the displacement which corresponds to the fraction number is proposed. Through this method, the integer fringe counting error can be eliminated. The realization of the method is designed in detail. The experimental setup was constructed and the displacement experiment was performed in the range of 15 µm with 1 µm increment. The experimental results show that the average error is −2.64 nm and the standard deviation is 0.47 nm. This demonstrates the feasibility of the signal processing method for the laser synthetic wavelength interferometer

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/21/1/015106

Additional details

Identifiers

DOI
10.1088/0957-0233/21/1/015106;
PII
S0957-0233(10)29415-8;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
21
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45005495
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; DESIGN; ERRORS; INTERFEROMETERS; LASERS; PROCESSING; SIGNALS; WAVELENGTHS
Descriptors DEC
MEASURING INSTRUMENTS