Published June 1, 1998
| Version v1
Journal article
Homogeneity of CdZnTe detectors
Creators
- 1. Sandia National Labs., Livermore, CA (United States)
- 2. The Hebrew University of Jerusalem, Jerusalem 91904 (Israel)
- 3. Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow distr. 142432 (Russian Federation)
- 4. UCLA, Los Angeles, CA 90024 (United States)
- 5. Carnegie Mellon University (CMU), Pittsburgh, PA 15213 (United States)
Description
We describe the current state of nuclear radiation detectors produced from single crystals of Cd1-xZnxTe (CZT), with 0.04<x<0.4, grown by the vertical high pressure Bridgman (VHPB) method. The crystals investigated were grown commercially both in the USA and at the Institute of Solid State Physics, Chernogolska, Russia. The CZT was evaluated by Sandia National Laboratories and the UCLA and CMU groups using proton-induced X-ray emission (PIXE), X-ray diffraction (XRD), photoluminescence (PL), infrared (IR) transmission microscopy, leakage current measurements and response to nuclear radiation. We discuss the homogeneity of the various CZT crystals based on the results from these measurement techniques. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 410
- Journal Issue
- 1
- Journal Page Range
- p. 100-106
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international workshop on GaAs detectors and related compounds
- Dates
- 17-20 Jun 1997
- Place
- Udine (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 29051952
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CADMIUM TELLURIDES; CDTE SEMICONDUCTOR DETECTORS; LEAKAGE CURRENT; MONOCRYSTALS; PHOTOLUMINESCENCE; PIXE ANALYSIS; RESPONSE FUNCTIONS; TEMPERATURE RANGE 0000-0013 K; X-RAY DIFFRACTION; ZINC TELLURIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTALS; CURRENTS; DIFFRACTION; ELECTRIC CURRENTS; EMISSION; FUNCTIONS; LUMINESCENCE; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE; X-RAY EMISSION ANALYSIS; ZINC COMPOUNDS
Optional Information
- Notes
- 31 refs.