Published June 2006 | Version v1
Journal article

Electrical properties of the ZnO nanowire transistor and its analysis with equivalent circuit model

  • 1. Korea University, Seoul (Korea, Republic of)
  • 2. Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstrass, Stuttgart (Germany)
  • 3. UC Davis, Davis, CA (United States)

Description

A single ZnO nanowire field-effect transistor(FET) was fabricated and its current-voltage characteristics were recorded at the temperatures ranging from T = 107 K to 300 K. Current-voltage characteristics showed typical non-ohmic behaviors with noticeable temperature dependence of the carrier concentration and the mobilities, reflecting the influence of the contact barriers formed between the ZnO nanowire and metal electrodes. In this paper, an equivalent circuit model of the ZnO nanowire FET and its analysis methods with PSPICE simulation are suggested in order to model the contact barriers in nanowire devices.

Additional details

Publishing Information

Journal Title
Journal of the Korean Physical Society
Journal Volume
48
Journal Issue
6
Series
16 refs, 5 figs
Journal Page Range
p. 1565-1569
ISSN
0374-4884