Published June 2006
| Version v1
Journal article
Electrical properties of the ZnO nanowire transistor and its analysis with equivalent circuit model
Creators
- 1. Korea University, Seoul (Korea, Republic of)
- 2. Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstrass, Stuttgart (Germany)
- 3. UC Davis, Davis, CA (United States)
Description
A single ZnO nanowire field-effect transistor(FET) was fabricated and its current-voltage characteristics were recorded at the temperatures ranging from T = 107 K to 300 K. Current-voltage characteristics showed typical non-ohmic behaviors with noticeable temperature dependence of the carrier concentration and the mobilities, reflecting the influence of the contact barriers formed between the ZnO nanowire and metal electrodes. In this paper, an equivalent circuit model of the ZnO nanowire FET and its analysis methods with PSPICE simulation are suggested in order to model the contact barriers in nanowire devices.
Additional details
Publishing Information
- Journal Title
- Journal of the Korean Physical Society
- Journal Volume
- 48
- Journal Issue
- 6
- Series
- 16 refs, 5 figs
- Journal Page Range
- p. 1565-1569
- ISSN
- 0374-4884
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 43010850
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; EQUIVALENT CIRCUITS; FABRICATION; FIELD EFFECT TRANSISTORS; MATHEMATICAL MODELS; NANOSTRUCTURES; TEMPERATURE DEPENDENCE; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; SIMULATION; TRANSISTORS; ZINC COMPOUNDS