Published November 2015
| Version v1
Journal article
Role of yttrium in activation of 〈c + a〉 slip in magnesium: An atomistic approach
- 1. Department of Material Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784 (Korea, Republic of)
- 2. Energy Components and Materials R&BD Group, Korea Institute of Industrial Technology (KITECH), Busan 618-230 (Korea, Republic of)
- 3. Graduate Institute of Ferrous Technology, Pohang University of Science and Technology (POSTECH), Pohang 790-784 (Korea, Republic of)
Description
The effect of Y addition on the slip behavior of an edge dislocation on basal, prismatic and second-order pyramidal slip planes of Mg has been investigated using a molecular dynamics simulation. It is found that Y increases the critical resolved shear stress of basal slip more than that of non-basal slip and eventually reduces the difference in the CRSS between different slip systems, which is proposed as the reason for the experimentally reported activation of 〈c + a〉 slip in Mg–Y alloys
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2015.06.028Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2015.06.028;
- PII
- S1359-6462(15)00276-6;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 108
- Journal Page Range
- p. 104-108
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47041241
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EDGE DISLOCATIONS; INTERMETALLIC COMPOUNDS; MAGNESIUM; MAGNESIUM ALLOYS; MOLECULAR DYNAMICS METHOD; SHEAR; SLIP; STRESSES; YTTRIUM; YTTRIUM ADDITIONS
- Descriptors DEC
- ALKALINE EARTH METALS; ALLOYS; CALCULATION METHODS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS; ELEMENTS; LINE DEFECTS; METALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.