Published September 2019 | Version v1
Journal article Metadata-only

Enhanced dielectric and magnetoelectric properties in multiferroic BCZT/LCMO epitaxial heterostructure

Creators

  • 1. State Key Lab of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070 (China)
  • 2. Hubei Key Laboratory of Advanced Technology for Automotive Components, Wuhan University of Technology, Wuhan 430070 (China)
  • 3. State Key Laboratory of Powder Metallurgy, Central South University, Changsha 410083 (China)

Description

This study reports on the microstructure as well as dielectric and magnetoelectric properties of the Ba0.85Ca0.15Zr0.1Ti0.9O3/La0.67Ca0.33MnO3 (BCZT/LCMO) multiferroic heterostructure prepared by pulsed laser deposition. The XRD and TEM results identified the epitaxial growth of the heterostructure, and the interface between BCZT and LCMO was smooth without elemental inter-diffusion. The multiferroic nature of the BCZT/LCMO heterostructure was demonstrated by ferroelectric and ferromagnetic hysteresis loops. The enhanced multiferroic properties were achieved in the heterostructure as compared with single BCZT film, whose magnetoelectric coefficient was effectively promoted to 153.2 mV/cm·Oe.

Additional details

Identifiers

DOI
10.1016/j.apsusc.2019.05.186;
PII
S0169433219314941;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
487
Journal Page Range
p. 703-707
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55046040
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COMPARATIVE EVALUATIONS; DIFFUSION; ELECTRICAL PROPERTIES; ENERGY BEAM DEPOSITION; EPITAXY; FERROELECTRIC MATERIALS; FILMS; HYSTERESIS; LASER RADIATION; MAGNETIC PROPERTIES; MICROSTRUCTURE; PULSED IRRADIATION; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DEPOSITION; DIELECTRIC MATERIALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EVALUATION; IRRADIATION; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.