Time-of-flight analysis of positron-annihilation induced Auger-electrons and Re-emitted positrons
Description
We have developed a time-of-flight (TOF) energy-analyzer for positron-annihilation induced Auger-electron spectroscopy (PAES) at an intense slow positron beamline of the ETL electron linac facility. With the use of a linac-based intense slow positron beam (107-108 e+/s), the TOF analyzer enables high-speed and high energy-resolution PAES measurements. We have applied the TOF-PAES to the time-resolved analysis of surface chemical reactions and to Auger lineshape analysis which can provide informations on the chemical bonding of the top surface layer. The TOF analyzer can be used also for the energy analysis of re-emitted positrons. We carried out PAES and positron re-emission spectroscopy for 3C-SiC(100) during various surface treatments in ultra high vacuum to investigate the dependence of the positron re-emission on the surface composition. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 363-365
- Journal Page Range
- p. 542-546
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- 12. international conference on positron annihilation
- Acronym
- ICPA-12
- Dates
- 6-12 Aug 2000
- Place
- Munich (Germany)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 32030941
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNIHILATION; AUGER ELECTRON SPECTROSCOPY; ENERGY DEPENDENCE; ENERGY RESOLUTION; POSITRON SOURCES; POSITRONS; SILICON CARBIDES; SURFACE PROPERTIES; SURFACE TREATMENTS; TIME RESOLUTION; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; CARBIDES; CARBON COMPOUNDS; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; INTERACTIONS; LEPTONS; MATTER; PARTICLE INTERACTIONS; PARTICLE SOURCES; RADIATION SOURCES; RESOLUTION; SILICON COMPOUNDS; SPECTROSCOPY; TIMING PROPERTIES
Optional Information
- Notes
- 18 refs.